Traps and Noise Session
Session Type: Lecture
Session Code: B4L-G
Session Theme: 
Location: AV00.17
Date & Time: Wednesday September 13, 2017 (14:20 - 15:40)
Chair: Benjamin Iniguez,
Sadayuki Yoshitomi


    Papers are listed in the order they will be presented.

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1278 4 Modeling of Dynamic Trap Density Increase for Aging Simulation of Any MOSFET Circuits
Mitiko Miura-Mattausch, Hidenori Miyamoto, Hideyuki Kikuchihara, Dondee Navarro, Tapas K. Maiti, Nezam Rohbani, Cheny...
1090 4 Comprehensive Compact Electro-Thermal GaN HEMT Model
Muhammad Alshahed, Mina Dakran, Lars Heuken, Mohammed Alomari, Joachim Burghartz
1219 4 Trap-Assisted Carrier Transport Through the Multi-Stack Gate Dielectrics of HKMG nMOS Transistors: a Compact Model
Apoorva Ojha, Nihar Ranjan Mohapatra
1244 4 A New Verilog-A Compact Model of Random Telegraph Noise in Oxide-Based RRAM for Advanced Circuit Design
Francesco Maria Puglisi, Nicolò Zagni, Luca Larcher, Paolo Pavan