INVITED: Manufacture & Test Session
Session Type: Lecture
Session Code: A4L-J
Location: Salon Jarry
Date & Time: Monday May 23, 2016 (16:00 - 17:30)
Chair: Yiorgos Makris,
Haralampos Stratigopoulos


    Papers are listed in the order they will be presented.

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2379 14.6 Closing the Loop Between Analog Design and Test
Stephen Sunter
2462 14.6 Harnessing Fabrication Process Signature for Predicting Yield Across Designs
Ali Ahmadi, Haralampos-G Stratigopoulos, Amit Nahar, Bob Orr, Micha...
2408 14.6 Real-Time Test Data Acquisition and Data Processing Enabling Closed Loop Control Systems for Adaptive Test
Christian Streitwieser
2373 14.6 High-Speed Link Verification Based on Statistical Inference
Xuan Zeng, Chenlei Fang, Qicheng Huang, Fan Yang, Dian Zhou, Wei Ca...
2365 14.6 Identifying Systematic Spatial Failure Patterns Through Wafer Clustering
Mohamed Alawieh, Fa Wang, Xin Li